Customized Irradiation Facilities

D.I.S customizes ion irradiation facilities for the characterization of ion sources, ion optics, ion diagnostics as well as ion analytics.

Due to the highly modularized design of the facility components, easy exchange of beamline elements for testing and ion irradiation purposes is possible. Therefore, it can be adapted to a wide range of applications.

Verschiedene Hände in einem blauen Filter halten Zahnradteile zusammen.
Type of source
ECR (Electron Cyclotron Resonance)
Particle separation
Wien Filter, Dipole
Special features
  • Customizable Components: Most parts can be tailored to specific requirements, ensuring seamless integration into existing installations
  • High Adaptability: The setup is highly flexible and can be combined with or adapted to customer-specific components.
  • Comprehensive Solutions: Combines advanced ion sources (e.g., D.I.S EBIS C-1, D.I.S ECRIS-2.45), charged particle beam optics (e.g., electrostatic deflectors, Einzel lenses), diagnostics (e.g., Faraday cups, aperture systems), and analytics (e.g., Wien filter, electromagnetic dipole) for versatile ion irradiation and testing applications.