D.I.S customizes ion irradiation facilities for the characterization of ion sources, ion optics, ion diagnostics as well as ion analytics.
Due to the highly modularized design of the facility components, easy exchange of beamline elements for testing and ion irradiation purposes is possible. Therefore, it can be adapted to a wide range of applications.
Custom Solutions
The following table gives an exemplified overview of components that could be combined in an ion irradiation & test facility.
| Ion sources | D.I.S EBIS C-1 D.I.S ECRIS-2.45 |
| Charged particle beam optics |
Electrostatic deflectors |
| Charged particle beam diagnostics |
Faraday cups |
| Charged particle beam analytics | Wien filter Electromagnetic dipole |
Most parts can be customized according to specific requirements to perfectly fit into existing installations.
The setup is highly adaptable and therefore can be combined with and adapted to customer specific components as well.
D.I.S Germany offers Command & Control hardware and software in addition to the irradiation facility.